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Items where Author is "Ngo, Y.H."

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Article

Williams, A.D. and Ouchen, F. and Kim, S.S. and Ngo, Y.H. and Elhamri, S. and Siwecki, A. and Mou, S. and Campo, E.M. and Kozlowski, G. and Naik, R.R. and Grote, J. (2015) Graphene-based Test Platform in Potential Application for FET with Guanine as Gate Dielectric. Journal of Electronic Materials, 44 (10). pp. 3481-3485. DOI: 10.1007/s11664-015-3797-2

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