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On the measurement of the Pockels effect in strained silicon

Azedeh, S.S. and Merget, F. and Nezhad, M.P. and Witzens, J. (2015) On the measurement of the Pockels effect in strained silicon. Optics Letters, 40 (8). pp. 1877-1880. DOI: 10.1364/OL.40.001877

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Item Type: Article
Subjects: Research Publications
Departments: College of Physical and Applied Sciences > School of Electronic Engineering
Date Deposited: 07 Apr 2016 02:20
Last Modified: 07 Apr 2016 02:20
ISSN: 0146-9592
URI: http://e.bangor.ac.uk/id/eprint/6461
Identification Number: DOI: 10.1364/OL.40.001877
Publisher: Optical Society of America
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